Bi-Te Thin Film Produced by Ion Beam Sputtering: Impact of Beam Voltage in the Seebeck Coefficient

  1. Pires, A.L.
  2. Cruz, I.F.
  3. Ferreira-Teixeira, S.
  4. Resende, P.M.
  5. Pereira, A.M.
Journal:
Materials Today: Proceedings

ISSN: 2214-7853

Year of publication: 2017

Volume: 4

Issue: 12

Pages: 12383-12390

Type: Conference paper

DOI: 10.1016/J.MATPR.2017.10.007 GOOGLE SCHOLAR
Data source: Scopus