Probing surface electronic properties of a patterned conductive STO by reactive ion etching
- Jin, M.-J.
- Choe, D.
- Lee, S.Y.
- Park, J.
- Jo, J.
- Oh, I.
- Kim, S.-I.
- Baek, S.-H.
- Jeon, C.
- Yoo, J.-W.
Aldizkaria:
Applied Surface Science
ISSN: 0169-4332
Argitalpen urtea: 2019
Alea: 466
Orrialdeak: 730-736
Mota: Artikulua