Determination of the free carrier concentration in atomic-layer doped germanium thin films by infrared spectroscopy

  1. Calandrini, E.
  2. Ortolani, M.
  3. Nucara, A.
  4. Scappucci, G.
  5. Klesse, W.M.
  6. Simmons, M.Y.
  7. Di Gaspare, L.
  8. De Seta, M.
  9. Sabbagh, D.
  10. Capellini, G.
  11. Virgilio, M.
  12. Baldassarre, L.
Revue:
Journal of Optics (United Kingdom)

ISSN: 2040-8986 2040-8978

Année de publication: 2014

Volumen: 16

Número: 9

Type: Article

DOI: 10.1088/2040-8978/16/9/094010 GOOGLE SCHOLAR

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