Determination of the free carrier concentration in atomic-layer doped germanium thin films by infrared spectroscopy

  1. Calandrini, E.
  2. Ortolani, M.
  3. Nucara, A.
  4. Scappucci, G.
  5. Klesse, W.M.
  6. Simmons, M.Y.
  7. Di Gaspare, L.
  8. De Seta, M.
  9. Sabbagh, D.
  10. Capellini, G.
  11. Virgilio, M.
  12. Baldassarre, L.
Aldizkaria:
Journal of Optics (United Kingdom)

ISSN: 2040-8986 2040-8978

Argitalpen urtea: 2014

Alea: 16

Zenbakia: 9

Mota: Artikulua

DOI: 10.1088/2040-8978/16/9/094010 GOOGLE SCHOLAR

Garapen Iraunkorreko Helburuak