Experimental and ab-initio investigation of the microstructure and optoelectronic properties of FCM–CVD-prepared Al-doped ZnO thin films

  1. Jellal, I.
  2. Ahmoum, H.
  3. Khaaissa, Y.
  4. Nouneh, K.
  5. Boughrara, M.
  6. Fahoume, M.
  7. Chopra, S.
  8. Naja, J.
Revue:
Applied Physics A: Materials Science and Processing

ISSN: 1432-0630,  0947-8396

Année de publication: 2019

Volumen: 125

Número: 9

Type: Article

DOI: 10.1007/S00339-019-2947-4 GOOGLE SCHOLAR
La source de données: Scopus