Experimental and ab-initio investigation of the microstructure and optoelectronic properties of FCM–CVD-prepared Al-doped ZnO thin films
- Jellal, I.
- Ahmoum, H.
- Khaaissa, Y.
- Nouneh, K.
- Boughrara, M.
- Fahoume, M.
- Chopra, S.
- Naja, J.
ISSN: 1432-0630, 0947-8396
Datum der Publikation: 2019
Ausgabe: 125
Nummer: 9
Art: Artikel