Transmission electron microscopy investigation of SiC films grown on SiC substrates by solid-source molecular beam epitaxy
- Kaiser, U.
- Khodos, I.
- Brown, P.D.
- Chuvilin, A.
- Albrecht, M.
- Humphreys, C.J.
- Fissel, A.
- Richter, W.
ISSN: 0884-2914
Année de publication: 1999
Volumen: 14
Número: 8
Pages: 3226-3236
Type: Article