Transmission electron microscopy investigation of SiC films grown on SiC substrates by solid-source molecular beam epitaxy

  1. Kaiser, U.
  2. Khodos, I.
  3. Brown, P.D.
  4. Chuvilin, A.
  5. Albrecht, M.
  6. Humphreys, C.J.
  7. Fissel, A.
  8. Richter, W.
Aldizkaria:
Journal of Materials Research

ISSN: 0884-2914

Argitalpen urtea: 1999

Alea: 14

Zenbakia: 8

Orrialdeak: 3226-3236

Mota: Artikulua

DOI: 10.1557/JMR.1999.0436 GOOGLE SCHOLAR
Datuen iturria: Scopus