Defects in hexagonal SiC analyzed by molecular dynamics and HRTEM image simulations

  1. Biskupek, J.
  2. Kaiser, U.
  3. Chuvilin, A.
Revue:
Microscopy and Microanalysis

ISSN: 1431-9276

Année de publication: 2003

Volumen: 9

Número: SUPPL. 3

Pages: 204-205

Type: Communication dans un congrès

DOI: 10.1017/S1431927603022001 GOOGLE SCHOLAR
La source de données: Scopus