Defects in hexagonal SiC analyzed by molecular dynamics and HRTEM image simulations

  1. Biskupek, J.
  2. Kaiser, U.
  3. Chuvilin, A.
Journal:
Microscopy and Microanalysis

ISSN: 1431-9276

Year of publication: 2003

Volume: 9

Issue: SUPPL. 3

Pages: 204-205

Type: Conference paper

DOI: 10.1017/S1431927603022001 GOOGLE SCHOLAR
Data source: Scopus