Lattice parameter measurement by CBED: Accuracy limited by the noise

  1. Chuvilin, A.
  2. Kups, T.
  3. Kaiser, U.
Journal:
Microscopy and Microanalysis

ISSN: 1431-9276

Year of publication: 2003

Volume: 9

Issue: SUPPL. 3

Pages: 356-357

Type: Conference paper

DOI: 10.1017/S1431927603027028 GOOGLE SCHOLAR
Data source: Scopus