Enhanced compositional contrast in imaging of nanoprecipitates buried in a defective crystal using a conventional TEM

  1. Kaiser, U.
  2. Chuvilin, A.
Aldizkaria:
Microscopy and Microanalysis

ISSN: 1431-9276

Argitalpen urtea: 2003

Alea: 9

Zenbakia: 1

Orrialdeak: 36-41

Mota: Artikulua

DOI: 10.1017/S143192760303006X GOOGLE SCHOLAR