Enhanced resolution in subsurface near-field optical microscopy

  1. Krutokhvostov, R.
  2. Govyadinov, A.A.
  3. Stiegler, J.M.
  4. Huth, F.
  5. Chuvilin, A.
  6. Carney, P.S.
  7. Hillenbrand, R.
Revue:
Optics Express

ISSN: 1094-4087

Année de publication: 2012

Volumen: 20

Número: 1

Pages: 593-600

Type: Article

DOI: 10.1364/OE.20.000593 GOOGLE SCHOLAR lock_openAccès ouvert editor
La source de données: Scopus