Accurate measurement of electron beam induced displacement cross sections for single-layer graphene

  1. Meyer, J.C.
  2. Eder, F.
  3. Kurasch, S.
  4. Skakalova, V.
  5. Kotakoski, J.
  6. Park, H.J.
  7. Roth, S.
  8. Chuvilin, A.
  9. Eyhusen, S.
  10. Benner, G.
  11. Krasheninnikov, A.V.
  12. Kaiser, U.
Revue:
Physical Review Letters

ISSN: 0031-9007 1079-7114

Année de publication: 2012

Volumen: 108

Número: 19

Type: Article

DOI: 10.1103/PHYSREVLETT.108.196102 GOOGLE SCHOLAR