Accurate measurement of electron beam induced displacement cross sections for single-layer graphene
- Meyer, J.C.
- Eder, F.
- Kurasch, S.
- Skakalova, V.
- Kotakoski, J.
- Park, H.J.
- Roth, S.
- Chuvilin, A.
- Eyhusen, S.
- Benner, G.
- Krasheninnikov, A.V.
- Kaiser, U.
ISSN: 0031-9007, 1079-7114
Argitalpen urtea: 2012
Alea: 108
Zenbakia: 19
Mota: Artikulua