Accurate measurement of electron beam induced displacement cross sections for single-layer graphene

  1. Meyer, J.C.
  2. Eder, F.
  3. Kurasch, S.
  4. Skakalova, V.
  5. Kotakoski, J.
  6. Park, H.J.
  7. Roth, S.
  8. Chuvilin, A.
  9. Eyhusen, S.
  10. Benner, G.
  11. Krasheninnikov, A.V.
  12. Kaiser, U.
Revista:
Physical Review Letters

ISSN: 0031-9007 1079-7114

Any de publicació: 2012

Volum: 108

Número: 19

Tipus: Article

DOI: 10.1103/PHYSREVLETT.108.196102 GOOGLE SCHOLAR