In situ electrical characterization of palladium-based single electron transistors made by electromigration technique
- Arzubiaga, L.
- Golmar, F.
- Llopis, R.
- Casanova, F.
- Hueso, L.E.
Revue:
AIP Advances
ISSN: 2158-3226
Année de publication: 2014
Volumen: 4
Número: 11
Type: Article