In situ electrical characterization of palladium-based single electron transistors made by electromigration technique

1. Arzubiaga, L.
2. Golmar, F.
3. Llopis, R.
4. Casanova, F.
5. Hueso, L.E.

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DOI: 10.1063/1.4902170 GOOGLE SCHOLAR lock_openOpen access editor

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