In situ electrical characterization of palladium-based single electron transistors made by electromigration technique
- Arzubiaga, L.
- Golmar, F.
- Llopis, R.
- Casanova, F.
- Hueso, L.E.
Zeitschrift:
AIP Advances
ISSN: 2158-3226
Datum der Publikation: 2014
Ausgabe: 4
Nummer: 11
Art: Artikel
