A novel approach for measuring the intrinsic nanoscale thickness of polymer brushes by means of atomic force microscopy: Application of a compressible fluid model
- Cuellar, J.L.
- Llarena, I.
- Iturri, J.J.
- Donath, E.
- Moya, S.E.
ISSN: 2040-3364, 2040-3372
Ano de publicación: 2013
Volume: 5
Número: 23
Páxinas: 11679-11685
Tipo: Artigo