A novel approach for measuring the intrinsic nanoscale thickness of polymer brushes by means of atomic force microscopy: Application of a compressible fluid model

  1. Cuellar, J.L.
  2. Llarena, I.
  3. Iturri, J.J.
  4. Donath, E.
  5. Moya, S.E.
Aldizkaria:
Nanoscale

ISSN: 2040-3364 2040-3372

Argitalpen urtea: 2013

Alea: 5

Zenbakia: 23

Orrialdeak: 11679-11685

Mota: Artikulua

DOI: 10.1039/C3NR02929H GOOGLE SCHOLAR