A novel approach for measuring the intrinsic nanoscale thickness of polymer brushes by means of atomic force microscopy: Application of a compressible fluid model
- Cuellar, J.L.
- Llarena, I.
- Iturri, J.J.
- Donath, E.
- Moya, S.E.
ISSN: 2040-3364, 2040-3372
Argitalpen urtea: 2013
Alea: 5
Zenbakia: 23
Orrialdeak: 11679-11685
Mota: Artikulua