Resistive switching in multiferroic BiFeO3 films: Ferroelectricity versus vacancy migration

  1. Cardona Rodríguez, A.
  2. Arango, I.C.
  3. Gomez, M.F.
  4. Dominguez, C.
  5. Trastoy, J.
  6. Urban, C.
  7. Sulekar, S.
  8. Nino, J.C.
  9. Schuller, I.K.
  10. Ramírez, J.G.
Revue:
Solid State Communications

ISSN: 0038-1098

Année de publication: 2019

Volumen: 288

Pages: 38-42

Type: Article

DOI: 10.1016/J.SSC.2018.11.005 GOOGLE SCHOLAR
La source de données: Scopus