Resistive switching in multiferroic BiFeO3 films: Ferroelectricity versus vacancy migration

  1. Cardona Rodríguez, A.
  2. Arango, I.C.
  3. Gomez, M.F.
  4. Dominguez, C.
  5. Trastoy, J.
  6. Urban, C.
  7. Sulekar, S.
  8. Nino, J.C.
  9. Schuller, I.K.
  10. Ramírez, J.G.
Aldizkaria:
Solid State Communications

ISSN: 0038-1098

Argitalpen urtea: 2019

Alea: 288

Orrialdeak: 38-42

Mota: Artikulua

DOI: 10.1016/J.SSC.2018.11.005 GOOGLE SCHOLAR
Datuen iturria: Scopus