THz scattering-type near-field microscopy of semiconductor conductivity and mobility
- Keilmann, F.
- Huber, A.J.
- Aizpurua, J.
- Wittborn, J.
- Hillenbrand, R.
Proceedings:
CLEO/Europe - EQEC 2009 - European Conference on Lasers and Electro-Optics and the European Quantum Electronics Conference
ISBN: 9781424440801
Year of publication: 2009
Type: Conference paper