Texture of submicron Ni-Mn-Ga films studied by X-ray diffraction at the ANKA synchrotron source

  1. Chernenko, V.A.
  2. Doyle, S.
  3. Kohl, M.
  4. Müllner, P.
  5. Besseghini, S.
  6. Ohtsuka, M.
Revue:
Zeitschrift fur Kristallographie, Supplement

ISSN: 0930-486X

Année de publication: 2007

Volumen: 2

Número: 26

Pages: 229-234

Type: Communication dans un congrès

DOI: 10.1524/ZKSU.2007.2007.SUPPL_26.229 GOOGLE SCHOLAR
La source de données: Scopus