Texture of submicron Ni-Mn-Ga films studied by X-ray diffraction at the ANKA synchrotron source

  1. Chernenko, V.A.
  2. Doyle, S.
  3. Kohl, M.
  4. Müllner, P.
  5. Besseghini, S.
  6. Ohtsuka, M.
Aldizkaria:
Zeitschrift fur Kristallographie, Supplement

ISSN: 0930-486X

Argitalpen urtea: 2007

Alea: 2

Zenbakia: 26

Orrialdeak: 229-234

Mota: Biltzar ekarpena

DOI: 10.1524/ZKSU.2007.2007.SUPPL_26.229 GOOGLE SCHOLAR