Mapping VISIR Circuits for Computer-assisted Assessment

  1. Cuadros, J.
  2. Serrano, V.
  3. Lluch, F.
  4. Garcia-Zubia, J.
  5. Hernandez-Jayo, U.
Proceedings:
Proceedings of 2021 World Engineering Education Forum/Global Engineering Deans Council, WEEF/GEDC 2021

ISBN: 9781665424882

Year of publication: 2021

Pages: 524-527

Type: Conference paper

DOI: 10.1109/WEEF/GEDC53299.2021.9657349 GOOGLE SCHOLAR
Data source: Scopus