Towards Reliable Remote Laboratory Experiences: A Model for Maximizing Availability through Fault-Detection and Replication
- Villar-Martinez, A.
- Garcia-Zubia, J.
- Angulo, I.
- Rodriguez-Gil, L.
Journal:
IEEE Access
ISSN: 2169-3536
Year of publication: 2021
Volume: 9
Pages: 45032-45054
Type: Article