Characterization Technique to Reveal Critical Resonances in Nonlinear RF Circuits

  1. Otegi, N.
  2. Collantes, J.-M.
  3. Lizarraga, I.
  4. Gonzalez, J.M.
Aldizkaria:
IEEE Transactions on Instrumentation and Measurement

ISSN: 1557-9662,  0018-9456

Argitalpen urtea: 2022

Alea: 71

Mota: Artikulua

DOI: 10.1109/TIM.2022.3170883 GOOGLE SCHOLAR
Datuen iturria: Scopus