Characterization Technique to Reveal Critical Resonances in Nonlinear RF Circuits

  1. Otegi, N.
  2. Collantes, J.-M.
  3. Lizarraga, I.
  4. Gonzalez, J.M.
Revista:
IEEE Transactions on Instrumentation and Measurement

ISSN: 1557-9662,  0018-9456

Any de publicació: 2022

Volum: 71

Tipus: Article

DOI: 10.1109/TIM.2022.3170883 GOOGLE SCHOLAR
Font de les dades: Scopus