Nanosecond-range imprint and retention characterized from polarization-voltage hysteresis loops in insulating or leaky ferroelectric thin films
- Jiang, A.Q.
- Liu, X.B.
- Zhang, Q.
Revue:
Applied Physics Letters
ISSN: 0003-6951
Année de publication: 2011
Volumen: 99
Número: 14
Type: Article
