Nanosecond-range imprint and retention characterized from polarization-voltage hysteresis loops in insulating or leaky ferroelectric thin films
- Jiang, A.Q.
- Liu, X.B.
- Zhang, Q.
Aldizkaria:
Applied Physics Letters
ISSN: 0003-6951
Argitalpen urtea: 2011
Alea: 99
Zenbakia: 14
Mota: Artikulua
