Nanosecond-range imprint and retention characterized from polarization-voltage hysteresis loops in insulating or leaky ferroelectric thin films
- Jiang, A.Q.
- Liu, X.B.
- Zhang, Q.
Revista:
Applied Physics Letters
ISSN: 0003-6951
Any de publicació: 2011
Volum: 99
Número: 14
Tipus: Article