New post-processing method for interpretation of through casing resistivity (TCR) measurements
- Chen, Q.
- Pardo, D.
- Li, H.-B.
- Wang, F.-R.
ISSN: 0926-9851
Année de publication: 2011
Volumen: 74
Número: 1
Pages: 19-25
Type: Article
ISSN: 0926-9851
Année de publication: 2011
Volumen: 74
Número: 1
Pages: 19-25
Type: Article