Multi-Metrics Approach for Security, Privacy and Dependability in Embedded Systems
- Garitano, I.
- Fayyad, S.
- Noll, J.
ISSN: 1572-834X, 0929-6212
Year of publication: 2015
Volume: 81
Issue: 4
Pages: 1359-1376
Type: Article
ISSN: 1572-834X, 0929-6212
Year of publication: 2015
Volume: 81
Issue: 4
Pages: 1359-1376
Type: Article