Semi-automatic quality inspection of solar cell based on Convolutional Neural Networks

  1. Balzategui, J.
  2. Eciolaza, L.
  3. Arana-Arexolaleiba, N.
  4. Altube, J.
  5. Aguerre, J.-P.
  6. Legarda-Ereño, I.
  7. Apraiz, A.
Proceedings:
IEEE International Conference on Emerging Technologies and Factory Automation, ETFA

ISSN: 1946-0759,  1946-0740

ISBN: 9781728103037

Year of publication: 2019

Volume: 2019-September

Pages: 529-535

Type: Conference paper

DOI: 10.1109/ETFA.2019.8869359 GOOGLE SCHOLAR
Data source: Scopus