Simple and Affordable Method for Fast Transient Measurements of SiC Devices

  1. Garrido, D.
  2. Baraia-Etxaburu, I.
  3. Arza, J.
  4. Barrenetxea, M.
Revue:
IEEE Transactions on Power Electronics

ISSN: 1941-0107,  0885-8993

Année de publication: 2020

Volumen: 35

Número: 3

Pages: 2933-2942

Type: Article

DOI: 10.1109/TPEL.2019.2924358 GOOGLE SCHOLAR
La source de données: Scopus