The butterfly-a well-defined constant-current topography pattern on Si(001):H and Ge(001):H resulting from current-induced defect fluctuations

  1. Engelund, M.
  2. Godlewski, S.
  3. Kolmer, M.
  4. Zuzak, R.
  5. Such, B.
  6. Frederiksen, T.
  7. Szymonski, M.
  8. Sánchez-Portal, D.
Revue:
Physical Chemistry Chemical Physics

ISSN: 1463-9076

Année de publication: 2016

Volumen: 18

Número: 28

Pages: 19309-19317

Type: Article

DOI: 10.1039/C6CP04031D GOOGLE SCHOLAR lock_openAccès ouvert editor

Objectifs de Développement Durable

La source de données: Scopus