Surface defect detection of magnetic microwires by miniature rotatable robot inside SEM

  1. Wan, W.
  2. Lu, H.
  3. Zhukova, V.
  4. Ipatov, M.
  5. Zhukov, A.
  6. Shen, Y.
Journal:
AIP Advances

ISSN: 2158-3226

Year of publication: 2016

Volume: 6

Issue: 9

Type: Article

DOI: 10.1063/1.4962965 GOOGLE SCHOLAR lock_openOpen access editor

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