Polarization-Resolved Near-Field Characterization of Nanoscale Infrared Modes in Transmission Lines Fabricated by Gallium and Helium Ion Beam Milling

  1. Sarriugarte, P.
  2. Schnell, M.
  3. Chuvilin, A.
  4. Hillenbrand, R.
Aldizkaria:
ACS Photonics

ISSN: 2330-4022

Argitalpen urtea: 2014

Alea: 1

Zenbakia: 7

Orrialdeak: 604-611

Mota: Artikulua

DOI: 10.1021/PH500081K GOOGLE SCHOLAR
Datuen iturria: Scopus