Combined analysis of systematic and random uncertainties for different noise-figure characterization methodologies
- Collado, A.
- Collantes, J.M.
- De la Fuente, L.
- Otegi, N.
- Perea, L.
- Sayed, M.
Proceedings:
IEEE MTT-S International Microwave Symposium Digest
ISSN: 0149-645X
Year of publication: 2003
Volume: 2
Pages: 1419-1422
Type: Conference paper