In-Circuit Characterization of Low-Frequency Stability Margins in Power Amplifiers

  1. Gonzalez, J.M.
  2. Otegi, N.
  3. Anakabe, A.
  4. Mori, L.
  5. Barcenilla, A.
  6. Collantes, J.-M.
Aldizkaria:
IEEE Transactions on Microwave Theory and Techniques

ISSN: 0018-9480

Argitalpen urtea: 2019

Alea: 67

Zenbakia: 2

Orrialdeak: 822-833

Mota: Artikulua

DOI: 10.1109/TMTT.2018.2883568 GOOGLE SCHOLAR
Datuen iturria: Scopus