Unique Thickness-Dependent Properties of the van der Waals Interlayer Antiferromagnet MnBi2Te4 Films

  1. Otrokov, M.M.
  2. Rusinov, I.P.
  3. Blanco-Rey, M.
  4. Hoffmann, M.
  5. Vyazovskaya, A.Yu.
  6. Eremeev, S.V.
  7. Ernst, A.
  8. Echenique, P.M.
  9. Arnau, A.
  10. Chulkov, E.V.
Journal:
Physical Review Letters

ISSN: 1079-7114 0031-9007

Year of publication: 2019

Volume: 122

Issue: 10

Type: Article

DOI: 10.1103/PHYSREVLETT.122.107202 GOOGLE SCHOLAR