Nanoscale dielectric properties of insulating thin films: From single point measurements to quantitative images

  1. Riedel, C.
  2. Schwartz, G.A.
  3. Arinero, R.
  4. Tordjeman, P.
  5. Lévĉque, G.
  6. Alegría, A.
  7. Colmenero, J.
Journal:
Ultramicroscopy

ISSN: 0304-3991

Year of publication: 2010

Volume: 110

Issue: 6

Pages: 634-638

Type: Article

DOI: 10.1016/J.ULTRAMIC.2010.02.024 GOOGLE SCHOLAR
Data source: Scopus