On the use of electrostatic force microscopy as a quantitative subsurface characterization technique: A numerical study
- Riedel, C.
- Alegra, A.
- Schwartz, G.A.
- Arinero, R.
- Colmenero, J.
- Senz, J.J.
Aldizkaria:
Applied Physics Letters
ISSN: 0003-6951
Argitalpen urtea: 2011
Alea: 99
Zenbakia: 2
Mota: Artikulua