AFM based dielectric spectroscopy: Extended frequency range through excitation of cantilever higher eigenmodes

  1. Miccio, L.A.
  2. Kummali, M.M.
  3. Schwartz, G.A.
  4. Alegría, Á.
  5. Colmenero, J.
Revue:
Ultramicroscopy

ISSN: 1879-2723 0304-3991

Année de publication: 2014

Volumen: 146

Pages: 55-61

Type: Article

DOI: 10.1016/J.ULTRAMIC.2014.06.006 GOOGLE SCHOLAR

Objectifs de Développement Durable