Dielectric spectroscopy at the nanoscale by atomic force microscopy: A simple model linking materials properties and experimental response
- Miccio, L.A.
- Kummali, M.M.
- Schwartz, G.A.
- Alegría, Á.
- Colmenero, J.
ISSN: 1089-7550, 0021-8979
Année de publication: 2014
Volumen: 115
Número: 18
Type: Article