Dielectric spectroscopy at the nanoscale by atomic force microscopy: A simple model linking materials properties and experimental response

  1. Miccio, L.A.
  2. Kummali, M.M.
  3. Schwartz, G.A.
  4. Alegría, Á.
  5. Colmenero, J.
Revue:
Journal of Applied Physics

ISSN: 1089-7550 0021-8979

Année de publication: 2014

Volumen: 115

Número: 18

Type: Article

DOI: 10.1063/1.4875836 GOOGLE SCHOLAR