Dielectric spectroscopy at the nanoscale by atomic force microscopy: A simple model linking materials properties and experimental response
- Miccio, L.A.
- Kummali, M.M.
- Schwartz, G.A.
- Alegría, Á.
- Colmenero, J.
ISSN: 1089-7550, 0021-8979
Year of publication: 2014
Volume: 115
Issue: 18
Type: Article