Post-implantation annealing of SiC studied by slow-positron spectroscopies

  1. Brauer, G.
  2. Anwand, W.
  3. Coleman, P.G.
  4. Störmer, J.
  5. Plazaola, F.
  6. Campillo, J.M.
  7. Pacaud, Y.
  8. Skorupa, W.
Aldizkaria:
Journal of Physics Condensed Matter

ISSN: 0953-8984

Argitalpen urtea: 1998

Alea: 10

Zenbakia: 5

Orrialdeak: 1147-1156

Mota: Artikulua

DOI: 10.1088/0953-8984/10/5/022 GOOGLE SCHOLAR