A pulsed S-parameters measurement setup for the non-linear characterization of FETs and bipolar power transistors
- Teyssier, J.P.
- Campovecchio, M.
- Sommet, C.
- Portilla, J.
- Quere, R.
Actas:
1993 23rd European Microwave Conference, EuMA 1993
Ano de publicación: 1993
Páxinas: 489-493
Tipo: Achega congreso
